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Charged particle optic electron and ion guns, focusing columns, and high-brightness sources are at the heart of FEI's Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), and DualBeam tools serving the Nanotechnology market. FEI seeks an intern to assist in the initiation, design, development, execution, and implementation of a wide range of electron gun, ion column, and field emission source development projects.
Activities will include one or more of the following tasks as determined by program needs, project priorities, intern capabilities and interests.
Perform experiments as directed by scientists and engineers: Determination of temperature from I/V characteristics Development of new liquid metal ion source (LMIS) technology Periodic thermal imaging pyrometry monitoring of on-going experiments Cold field emitter (CFE) assembly (etch W tips, attach, SEM) High current ion source monitoring and characterization Noise measurements on Schottky emitters Energy spread measurements Brightness measurements
Analyze and document experimental results: Analyze experimental data to determine temperature from I/V characteristics Assist in the development of data acquisition and analysis software Development and testing of new laboratory and instrument control software Development and testing of new ion source monitoring software Development and characterization of automated source control software Maintain, troubleshoot, and repair laboratory equipment as necessary: Work with scientists and engineers to diagnose and repair equipment issues Change pump oil as necessary
Minimum Education, Experience and Qualifications:
High School degree Interest and demonstrated aptitude in physics, engineering, and/or computer science. Ability to work in a team environment. Proficient with standard office computer programs (Word, Excel, Power Point, etc.).
Additional Desirable Qualifications: 2 years of college course work in science and/or engineering. Demonstrated laboratory experience and hands-on skills. Computer programming experience (Visual Basic, Lab View, C++).
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About FEI Co
FEI Company is a supplier of instruments for nanoscale imaging, analysis and prototyping to enable research, development and manufacturing in a range of industrial, academic and research institutional applications. The Company's products and systems include focused ion beam systems (FIBs), scanning electron microscopes (SEMs), transmission electron microscopes (TEMs) and DualBeam systems, which combine a FIB and SEM on a single platform. The Company's DualBeam systems include models that have wafer handling capability that are purchased by semiconductor and data storage manufacturers (wafer-level DualBeam systems) and models that have small stages and are sold to customers in several markets (small-stage DualBeam systems). The Company's sales and service operations are conducted in the United States and approximately 50 other countries around the world. In June 2009, FEI Company acquired the Mineral Liberation Analysis business of JKTech Pty Ltd.